Evaluation Board Manual
Preliminary PPC750FX Evaluation Board
750FXebm_ch10.fm
June 10, 2003
Connectors
Page 69 of 115
10.12 Test Connections
Access to selected points in the board circuits, not available through connectors or jumpers, is provided by
small test connections. All of the test connections are small pads with a center hole. An electrical connection
can be made to any of these test connections for test purposes. These test connections are documented in
the schematic, in Table 10-13, and in Figure 10-13.
There are two kinds of test connections. The basic difference between the two is the size of the pad and the
center hole. One type of test connection is called a test point and has a large pad and center hole. Test points
are suitable for soldering wires to them for test and design purposes. The reference designators for test
points are TPnn where nn are numbers. The other type of test connection is called an ehole or test access
via. These test connections have a very small pad and center hole. The reference designators for eholes are
Unn where nn are numbers.
To determine what signal the test connection connects to, refer to the schematic. In Figure 10-13, the test
connections are labeled with their reference designators only. The actual pad and hole is not shown. Other
major components on the board are shown for assistance in locating the test connections.
Table 10-13. Test Connections
Location Component Signal
TP1 U20 LBOOT_CS_N
TP2 U20 LDEV_RW_N
TP3 U18 +2.5V VADJ
TP4 U50 P07
TP5 U50 INT_N
TP6 U3 System Controller CS2_N
TP7 U3 System Controller CS3_N
TP8 U3 System Controller JTD0
TP9 U1 750FX QREQ0
TP10 U50 P17
TP11 U3 System Controller MPP13
TP12 U1 750FX WTI
TP13 U3 System Controller MPP16
TP14 U3 System Controller MPP15
TP15 U1 750FX CI
TP16 U3 System Controller DEVDP0
TP17 U1 750FX RSRV0
TP18 U3 System Controller MPP18
TP19 U3 System Controller MPP17
TP20 U3 System Controller DEVDP1
TP21 U1 750FX CLK_OUT0
TP22 U3 System Controller DEVDP3
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