Keithley 2182 - MX+B and Percent (%)

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4

Relative, mX+b, and

Percent (%)

Relative, mX+b,

and Percent

(%)

Table of Contents

Default Chapter5
- Safety Precautions5
- Table of Contents7
- List of Tables19
Getting Started23
- General Information25
- Nanovoltmeter Features28
- Front and Rear Panel Familiarization29
  - Front Panel Summary29
  - Figure 1-1 Model 2182 Front Panel29
Getting Started30
- Getting Started31
  - Rear Panel Summary33
  - Figure 1-2 Model 2182 Rear Panel33
- Cleaning Input Connectors35
- Power-Up36
- Display38
  - Status and Error Messages38
- Default Settings38
- Table 1-2 Factory Defaults39
Voltage and Temperature Measurements41
- Measurement Overview43
  - Voltage Measurements43
  - Temperature Measurements43
- Performance Considerations45
- Line Cycle Synchronization48
  - Pumpout Current (Low Charge Injection Mode)49
  - SCPI Programming - ACAL, Front Autozero, Autozero, LSYNC, and Low Charge Injection50
- Connections52
- LEMO Connector - Terminal Identification53
  - Voltage Only Connections54
- Connections - Single Channel Voltage54
- Measuring Voltage and Temperature59
  - SCPI Programming - Voltage and Temperature Measurements60
- Low-Level Considerations62
Range, Digits, Rate, and Filter69
- Range71
- Autoranging72
- Table 3-1 SPCI Commands - Range72
- Table 3-2 SPCI Commands - Digits73
- Figure74
- Speed Vs. Noise Characteristics74
3 Range, Digits, Rate, and Filter72
- Rate74
  - SCPI Programming - Rate75
  - Table 3-3 SCPI Commands - Rate75
- Filter76
- Figure 3-2 Moving and Repeating Filters78
Relative80
- Digital Filter81
- MX+B and Percent (%)83
Ratio and Delta91
- Ratio92
- Filter, Rel, and Ranging Considerations94
- Delta96
- Figure97
- Test Circuit Using Constant Current Source97
- Figure 5-1 Test Circuit Using Constant Current Source97
- Figure98
- Delta Measurement Using Bipolar Source98
- Figure 5-2 Delta Measurement Using Bipolar Source98
- Selecting Delta99
- Figure101
- Delta Measurement Connections101
- Figure 5-3 Delta Measurement Connections101
- Figure104
- Triggering Timing Diagram104
- Figure 5-4 Triggering Timing Diagram104
- Filter Considerations105
- SCPI Programming - Ratio and Delta106
- Figure108
- Calibrating 1:10 Divider108
  - Applications108
  - Testing Superconductor Materials109
  - Figure110
- Test Circuit-Fixed I (Vary H)110
- Figure 5-6 Test Circuit—Fixed I (Vary H)110
- Figure 5-7 H-V Curve (Fixed I)111
- Figure111
- Sourcemeter Output-2-Point Custom Sweep111
- Figure 5-9 I-V Curve (Fixed H)112
- Figure 5-10 Test Circuit-Fixed H (Vary I)113
- Figure 5-11 Sourcemeter Output-30-Point Custom Sweep115
- Figure 5-12 Trigger Link Connections Using Two Model 2182S116
Buffer117
- Buffer Operations118
- SCPI Programming - Buffer121
- Programming Example122
Triggering123
- Figure125
7 Triggering126
- DUT Test System131
  - Figure131
  - Trigger Link Connections131
    - External Triggering Example131
- Operation Model for Triggering Example132
Limits142
- Figure 8-1 Default Limits143
- Application147
Stepping and Scanning149
- Step/Scan Overview151
- Front Panel Trigger Models152
  - Figure153
  - Front Panel Triggering (Internal Scanning)153
- Front Panel Triggering (Other Step/Scan Operations)153
  - Figure 9-1 Front Panel Triggering (Internal Scanning)153
  - Other Stepping/Scanning Operations154
- Stepping/Scanning Examples156
- SCPI Programming - Stepping and Scanning160
- Overview171
- Operation173
- SCPI Programming - Analog Output174
  - Interfaces177
Remote Operation179
- Figure 11-1 IEEE-488 Connector180
- Figure180
- GPIB Operation and Reference180
Common Commands206
- Figure 12-1 Standard Event Enable Register209
14 SCPI Reference Tables226
- Table 14-1 Calculate Command Summary226
- Table 14-3 Display Command Summary226
- Table 14-4 Format Command Summary226
- Table 14-6 Route Command Summary230
- Table 14-7 Sense Command Summary231
- Table 14-10 Trace Command Summary236
- Table 14-11 Trigger Command Summary237
- Table 14-12 UNIT Command Summary238
Additional SCPI Commands240
- Display Subsystem241
- Figure 15-1 ASCII Data Format242
- Format Subsystem242
- Status Subsystem245
- System Subsystem254
B Status and Error Messages264
- Table B-1 Status and Error Messages264
- Measurement Considerations269
- Measurement Considerations270
500 D Model 182 Emulation Commands280
- Table D-1 Model 182 Device-Dependent Command Summary280
- Program Examples286
- IEEE-488 Bus Overview293
F IEEE-488 Bus Overview302
- Figure F-3 Command Codes302
- Table F-2 Hexadecimal and Decimal Command Codes302
- Common Commands302
G IEEE-488 and SCPI Conformance Information309
- Table G-2 Coupled Commands309
- Fetch?312
- Limitations313
- Sense[1]]:Data:fresh?314
- Examples315
Delta, Pulse Delta and Differential Conductance317
- Overview318
- Operation Overview319
- Figure I-1 Delta, Pulse Delta, and Differential Conductance Measurements320
- Figure321
- Test System Configurations321
- Test System Conﬁgurations321
- Delta Measurement Process322
  - Delta Measurement Technique322
  - Figure322
- Pulse Delta 3-Point Measurement Technique325
- Pulse Delta Process325
- Differential Conductance Process330
- Selecting and Configuring an Interface337

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