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SKF IMx-1 - On-Demand Measurements; Enlight Collect IMX-1 System View

SKF IMx-1
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INTEGRATION WITH SKF @PTITUDE OBSERVER
Enlight Collect IMx-1 System View
SKF Enlight Collect IMx-1 System
User Manual
Revision F
27 (101)
2.2.1 On-demand measurements
On-demand measurement requests data acquisition to the gateway and is activated
in the @ptitude Observer Hierarchy. Request can be triggered at the machine level,
sub-machine level or measurement point level.
Right-click on the desired level in the hierarchy and select Trigger on-demand
measurement > Trend data.
Figure 12 Access the Enlight Collect IMx-1 System view
When the measurement is collected, it can be seen in the Trend List.
For more information about On-demand measurements and other Hierarchy right-
click functions, refer to the Observer user manual.
2.3 Enlight Collect IMx-1 System View
This is a dedicated window that provides gateway and sensor information and access
to IMx-1 system configuration functions. Get to this system view from On-line >
Enlight Collect IMx-1 System view:
Figure 13 Access the Enlight Collect IMx-1 System view

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