EasyManuals Logo
Home>Texas Instruments>Microcontrollers>TMS570LS0714

Texas Instruments TMS570LS0714 User Manual

Texas Instruments TMS570LS0714
162 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #49 background imageLoading...
Page #49 background image
49
TMS570LS0714
www.ti.com
SPNS226E JUNE 2013REVISED NOVEMBER 2016
Submit Documentation Feedback
Product Folder Links: TMS570LS0714
System Information and Electrical SpecificationsCopyright © 2013–2016, Texas Instruments Incorporated
6.5.6 CPU Self-Test
The CPU STC (Self-Test Controller) is used to test the two Cortex-R4F CPU Cores using the
Deterministic Logic BIST Controller as the test engine.
The main features of the self-test controller are:
Ability to divide the complete test run into independent test intervals
Capable of running the complete test as well as running few intervals at a time
Ability to continue from the last executed interval (test set) as well as ability to restart from the
beginning (First test set)
Complete isolation of the self-tested CPU core from rest of the system during the self-test run
Ability to capture the Failure interval number
Time-out counter for the CPU self-test run as a fail-safe feature
6.5.6.1 Application Sequence for CPU Self-Test
1. Configure clock domain frequencies.
2. Select number of test intervals to be run.
3. Configure the time-out period for the self-test run.
4. Enable self-test.
5. Wait for CPU reset.
6. In the reset handler, read CPU self-test status to identify any failures.
7. Retrieve CPU state if required.
For more information see the device Technical Reference Manual.
6.5.6.2 CPU Self-Test Clock Configuration
The maximum clock rate for the self-test is HCLKmax/2. The STCCLK is divided down from the CPU
clock. This divider is configured by the STCCLKDIV register at address 0xFFFFE108.
For more information see the device-specific Technical Reference Manual.
6.5.6.3 CPU Self-Test Coverage
Table 6-7 lists the CPU self-test coverage achieved for each self-test interval. It also lists the cumulative
test cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock
period.
Table 6-7. CPU Self-Test Coverage
INTERVALS TEST COVERAGE, % STCCLK CYLCES
0 0 0
1 62.13 1365
2 70.09 2730
3 74.49 4095
4 77.28 5460
5 79.28 6825
6 80.90 8190
7 82.02 9555
8 83.10 10920
9 84.08 12285
10 84.87 13650
11 85.59 15015
12 86.11 16380

Table of Contents

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Texas Instruments TMS570LS0714 and is the answer not in the manual?

Texas Instruments TMS570LS0714 Specifications

General IconGeneral
BrandTexas Instruments
ModelTMS570LS0714
CategoryMicrocontrollers
LanguageEnglish

Related product manuals