Associated Research 620L User Manual

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From the Run Test Parameter Setting screen the following parameters may be
controlled: Voltage-HI, Voltage-LO, Amp-HI, Amp-LO, Delay Time, Dwell Time,
Leakage-HI, Leakage-LO, Power-HI, Power-LO, PF-HI, PF-LO and Continuous.
For detailed descriptions of these parameters refer to section 4.4.1. Description
of Test Parameters.
Note: Leakage in the Run Test mode refers to the amount of current
which flows from the enclosure (case) of the DUT to the neutral side of the
line input. The Leakage-HI trip limit is used to program the maximum
allowable earth leakage current of the DUT before failure. The Leakage-
LO trip limit is used to program the minimum allowable earth leakage
current of the DUT before failure.

Associated Research 620L Specifications

General

Brand	Associated Research
Model	620L
Category	Test Equipment
Language	English