Multi-Channel Sync Hipot Tester 19020/19020-4/19021/19021-4/19022/19022-4
User’s Manual
10GΩ~50GΩ: ± (10% of reading + 1% of full scale)
< 500V:
1MΩ~1GΩ: ± [3% of reading + (0.2 x 500V /Vs)% of full
0.03 – 999.9 sec., and Continuous (IR: 0.3 – 999.9 sec.)
Measured capacitance comparison.
320 x 240 dot matrix, blue, LED back light.
Leakage current offset compensation for WVAC, WVDC,
and IR testing
FAIL : High/Low Fail (WV, IR)
ARC Fail (WV)
Open/Short Fail (OSC)
30 instrument setups with up to 10 test steps can be stored
into and recalled from the internal memory.
Front panel keys can be locked to prevent undesired
operation.
Complies with tested values and comparator decision results
can be stored and output.
Standard: RS232, The programming language is SCPI.
Data buffer: One set of tested IEEE488.1 and 488.2. The
programming language is SCPI.
Data buffer: One set of values and comparator decision
results can be stored and output.
Handler interface (Standard)
Output channels Pass/Fail, Total Pass/Fail (Lo: Pass , Hi:
Fail)
Start trigger (I/P): Falling edge trigger.
Stop Testing (I/P): Falling edge trigger.
Memory recall(I/P): 7 sets
+Vint: 5V, 40~60mA limit current.
Common Int.
External
+Vext: +3V~+26V allowable.
PASS(short Sound)
FAIL: High, Low, ARC, System Error(Long Sound)