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Overview of the 33XX Automatic Transformer Test System and its capabilities.
Lists various measurement parameters and their definitions.
Details frequency, signal level, and output impedance of the test signals.
Lists the measurable ranges for various parameters like impedance, capacitance, inductance.
Specifies measurement accuracy conditions and warm-up time.
Comprehensive accuracy specifications including |Z|-θ, L, C, R, D, Q, R, DCR, Turn-Ratio.
Explains Zero open, Zero short, and Load correction functions.
Describes the multi-frequency or test signal level programming feature.
Explains bin sorting and decision output for measurement parameters.
Lists available interfaces like Printer, RS-232, and Handler.
Provides details on Display, Power, Environment, Dimensions, and Weight.
Guidelines for operating and storing the instrument in suitable environments.
Instructions for connecting the power cord and selecting voltage/frequency.
Details fuse specifications and replacement procedure.
Recommends using a power regulator for stable measurements.
Explains how to connect the DUT using BNC connectors for various tests.
Instructions for adjusting LCD contrast via system configuration.
Details the components and functions of the instrument's front panel.
LCD Display, Cursor, Number/Symbol, Clear/Help keys.
Selective, Measure Display, Main Function, System Setup, Start/Trig keys.
OPT/LOCK, ENTER, RESET, POWER switch, Memory card slot.
Describes the connectors and switches on the rear panel.
AC Line Socket, Output Line, Voltage Switch, Power Fuse.
Ground Terminal, Scan, Handler, Printer, RS-232, DCA interface slots.
Description of how to set system parameters.
Initial setup and configuration of system parameters.
Controls for display contrast, back-light, and buzzer volume.
Settings for test parameters, frequency, display modes, and deviation.
Settings for sounds, alarms, constants, passwords, delay time, and special tests.
BIAS ENABLE, TRIG. DELAY settings.
Instructions on how to operate the instrument for various tests.
Procedure for performing an open circuit test.
Procedure for performing a short circuit test.
Steps for performing a single transformer test.
Setting test conditions like frequency, voltage, mode.
Example of setting transformer parameters for Np, Ns, Lx, Lk, DCR.
Setting leakage inductance for primary windings.
Setting DC resistance for primary windings.
Operation of the 3001A scan box test fixture.
Settings for Transformer ID, Primary, Secondary, Auto-Test Time, Deviation, Retest Number.
Setting test conditions, pin mapping, and transformer/fixture pin numbers.
Configuration for leakage inductance, DC resistance, pin short, and balance judgments.
Describes the test condition setting for automatic scan.
Setting different frequencies for multi-frequency scan tests.
Setting ACR test voltage and frequency.
Setting Zx test voltage and frequency.
Testing transformer pin and phasing settings for parallel tests.
Testing transformer pin and phasing settings for series tests.
Procedure for setting up the deviation error compensation function.
Entering the LCRZ parameter analysis test.
Procedure for performing a compare test.
Procedure for setting bins for sorting test results.
Performing multi-frequency scan tests.
Explanation of how to upload calibration data.
Displays fast function keys for transformer testing.
New DCA functions and operations.
Discusses low impedance measurement considerations.
Connecting the bias current source.
Describes various test applications and their specific requirements.
Measurement of large inductance values.
Measuring turn ratio with low coupling.
Connecting bias current for large inductance.
Measuring nonlinear inductors and transformers.
Details the interface and operation of the Scan Box.
Explains the test items and functions of the scan interface.
Important precautions before using the scan interface.
Describes the controls and indicators on the scan box front panel.
Indicators for test results (GOOD/NO GOOD).
Trigger control and indicator for test start.
Indicators for specific measurement failures.
Control area for test start and reset.
Describes the connectors on the scan box rear panel.
Terminal for test cable connection.
Interface socket for scan test signals.
Power cord connection for the scan box.
Socket for air control lines.
Socket for foot switch control.
Overview of the scan box components.
Description of the test fixture and its setup.
The main push power component of the fixture.
Controls cylinder air input/output.
Knob for adjusting piston speed.
Knob for quiet operation and dust avoidance.
Connection for air pressure for the piston.
Setting the transformer identifier for the scan test.
Setting the primary winding number for scan test.
Setting the secondary winding number for scan test.
Setting the interval time for automatic tests.
Setting the deviation range percentage.
Setting the number of repeat tests for no-good items.
Setting test frequency and voltage parameters.
Setting transformer and fixture pin configurations.
Setting transformer turn ratio and phase judgment.
Setting transformer inductance and Q value judgment.
Setting transformer leakage inductance judgment.
Setting judgment for leakage inductance.
Inputting leakage inductance LK1 value and pin settings.
Inputting leakage inductance LK2 value and pin settings.
Setting DC resistance judgment for transformer windings.
Setting judgment for transformer pin short.
Setting transformer balance parameters.
Setting transformer capacitance parameters.
Screen for automatic pin number configuration.
Displaying judgment results (pass/fail).
Screen for viewing test statistics.
Screen for confirming data storage.
Settings for print options like title, data, sampling.
Setting specific fields for printing.
Choosing items to be printed.
Setting sampling quantity and count for statistics.
Accessing memory card data storage.
Selecting and printing statistics graphs.
General information and connection of the handler interface.
Describes timing guidelines and signal logic for handler interface.
General description, connector, and signal line specs for RS-232C.
Steps to configure baud rate, parity, word length, and ON/OFF.
Commands for LCR and Transformer tests via RS-232.
Details the byte structure for transformer measurement data.
Format for LCR pure value and BIAS SCAN data.
Notes on data recall/save compatibility with main board/card sizes.
Overview of the 33XX Automatic Transformer Test System and its capabilities.
Lists various measurement parameters and their definitions.
Details frequency, signal level, and output impedance of the test signals.
Lists the measurable ranges for various parameters like impedance, capacitance, inductance.
Specifies measurement accuracy conditions and warm-up time.
Comprehensive accuracy specifications including |Z|-θ, L, C, R, D, Q, R, DCR, Turn-Ratio.
Explains Zero open, Zero short, and Load correction functions.
Describes the multi-frequency or test signal level programming feature.
Explains bin sorting and decision output for measurement parameters.
Lists available interfaces like Printer, RS-232, and Handler.
Provides details on Display, Power, Environment, Dimensions, and Weight.
Guidelines for operating and storing the instrument in suitable environments.
Instructions for connecting the power cord and selecting voltage/frequency.
Details fuse specifications and replacement procedure.
Recommends using a power regulator for stable measurements.
Explains how to connect the DUT using BNC connectors for various tests.
Instructions for adjusting LCD contrast via system configuration.
Details the components and functions of the instrument's front panel.
LCD Display, Cursor, Number/Symbol, Clear/Help keys.
Selective, Measure Display, Main Function, System Setup, Start/Trig keys.
OPT/LOCK, ENTER, RESET, POWER switch, Memory card slot.
Describes the connectors and switches on the rear panel.
AC Line Socket, Output Line, Voltage Switch, Power Fuse.
Ground Terminal, Scan, Handler, Printer, RS-232, DCA interface slots.
Description of how to set system parameters.
Initial setup and configuration of system parameters.
Controls for display contrast, back-light, and buzzer volume.
Settings for test parameters, frequency, display modes, and deviation.
Settings for sounds, alarms, constants, passwords, delay time, and special tests.
BIAS ENABLE, TRIG. DELAY settings.
Instructions on how to operate the instrument for various tests.
Procedure for performing an open circuit test.
Procedure for performing a short circuit test.
Steps for performing a single transformer test.
Setting test conditions like frequency, voltage, mode.
Example of setting transformer parameters for Np, Ns, Lx, Lk, DCR.
Setting leakage inductance for primary windings.
Setting DC resistance for primary windings.
Operation of the 3001A scan box test fixture.
Settings for Transformer ID, Primary, Secondary, Auto-Test Time, Deviation, Retest Number.
Setting test conditions, pin mapping, and transformer/fixture pin numbers.
Configuration for leakage inductance, DC resistance, pin short, and balance judgments.
Describes the test condition setting for automatic scan.
Setting different frequencies for multi-frequency scan tests.
Setting ACR test voltage and frequency.
Setting Zx test voltage and frequency.
Testing transformer pin and phasing settings for parallel tests.
Testing transformer pin and phasing settings for series tests.
Procedure for setting up the deviation error compensation function.
Entering the LCRZ parameter analysis test.
Procedure for performing a compare test.
Procedure for setting bins for sorting test results.
Performing multi-frequency scan tests.
Explanation of how to upload calibration data.
Displays fast function keys for transformer testing.
New DCA functions and operations.
Discusses low impedance measurement considerations.
Connecting the bias current source.
Describes various test applications and their specific requirements.
Measurement of large inductance values.
Measuring turn ratio with low coupling.
Connecting bias current for large inductance.
Measuring nonlinear inductors and transformers.
Details the interface and operation of the Scan Box.
Explains the test items and functions of the scan interface.
Important precautions before using the scan interface.
Describes the controls and indicators on the scan box front panel.
Indicators for test results (GOOD/NO GOOD).
Trigger control and indicator for test start.
Indicators for specific measurement failures.
Control area for test start and reset.
Describes the connectors on the scan box rear panel.
Terminal for test cable connection.
Interface socket for scan test signals.
Power cord connection for the scan box.
Socket for air control lines.
Socket for foot switch control.
Overview of the scan box components.
Description of the test fixture and its setup.
The main push power component of the fixture.
Controls cylinder air input/output.
Knob for adjusting piston speed.
Knob for quiet operation and dust avoidance.
Connection for air pressure for the piston.
Setting the transformer identifier for the scan test.
Setting the primary winding number for scan test.
Setting the secondary winding number for scan test.
Setting the interval time for automatic tests.
Setting the deviation range percentage.
Setting the number of repeat tests for no-good items.
Setting test frequency and voltage parameters.
Setting transformer and fixture pin configurations.
Setting transformer turn ratio and phase judgment.
Setting transformer inductance and Q value judgment.
Setting transformer leakage inductance judgment.
Setting judgment for leakage inductance.
Inputting leakage inductance LK1 value and pin settings.
Inputting leakage inductance LK2 value and pin settings.
Setting DC resistance judgment for transformer windings.
Setting judgment for transformer pin short.
Setting transformer balance parameters.
Setting transformer capacitance parameters.
Screen for automatic pin number configuration.
Displaying judgment results (pass/fail).
Screen for viewing test statistics.
Screen for confirming data storage.
Settings for print options like title, data, sampling.
Setting specific fields for printing.
Choosing items to be printed.
Setting sampling quantity and count for statistics.
Accessing memory card data storage.
Selecting and printing statistics graphs.
General information and connection of the handler interface.
Describes timing guidelines and signal logic for handler interface.
General description, connector, and signal line specs for RS-232C.
Steps to configure baud rate, parity, word length, and ON/OFF.
Commands for LCR and Transformer tests via RS-232.
Details the byte structure for transformer measurement data.
Format for LCR pure value and BIAS SCAN data.
Notes on data recall/save compatibility with main board/card sizes.
General| Brand | Chroma |
|---|---|
| Model | 3300 |
| Category | Test Equipment |
| Language | English |
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