07
VCO Test This
test
cycles the VCO frequency from 400 to 500 MHz, in increments of 500 kHz.
The cycle rate can be adjusted by the sample rate pot. 07
tests
the VCO and the phase lock circuitry.
08
Power Meter Offset Test
This makes
it
possible to set the power meter zero DAC to any setting.
The setting
is
entered as a four digit hexidecimal number (figure
6-6).
The first two digits are used
to program the course offset DAC, and the last two digits program the fine offset DAC. Test 08
enables the power meter zero DAC to be tested, and can provide a DC level signal to aid in testing
the power meter circuit.
09
Power Meter Gain Test
This makes
it
possible to set the power meter sensing circuit to any num-
ber. The number
is
entered as a five digit hexidecimal number (figure
6-6)
in the following format.
1
st
digit
A1 07
U10 bits 4-7
2nd digit
A107
U10 bits 0-3
3rd digit
A107 U12 bits 4-7 (Power Meter Option only)
4th digit
A1 07 U12 bits 0-3 (Power Meter Option only)
5th digit bit
0
Sets Amp marked "1 5 dB Gain" to high gain
5th digit bit 1
Sets Amp marked "30 dB Gain" to high gain
Digit 5
is
a 2 bit number, so any number entered for digit 5 will be justified to a number from 0-3.
Test 09 checks the RF level and power meter circuits.
10
Information ReadIAlter Routine
Test 10 can read any microprocessor address and, if that address
is
RAM or
110,
change
its
contents. The desired address
is
entered as a 4 digit hexidecimal number
(see figure 6-6). When the 4th digit is entered the counter will display the contents of the desired
address. The contents are then changed by entering a two digit hexidecimal number.
NOTE
Test 10 can change any temporary storage in
the counter, including locations that are essen-
tial to the operation of the counter. Changing
the wrong location will not damage the counter
permanently, but
it
can cause improper opera-
tion. To return the counter to proper operation
turn the counter off then back on.
11
Test 11 for the DAC option 01
is
described in Section 10.
Scans by ArtekMedia © 2007
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