Honeywell ST 800 Series - DE Diagnostic Messages; Table 29 - de Diagnostics

Page 92 ST 800 Series HART/DE Option User’s Manual Revision 5.0
9.3 DE Diagnostic Messages
Table 29 lists and describe DE diagnostics.
Table 29 – DE Diagnostics
Diagnostics Type Diagnostics Details/Resolution
Critical
(continued)
(continued)
Critical
NVM fault Possible causes:
The NVM in the Sensor board is corrupt
The NVM in the Electronics module is corrupt
Resolution:
Reset the device. If the problem persists, replace
the Meter Body.
RAM fault Possible causes:
The RAM in the Sensor board is corrupt
The RAM database in the Sensor board is
compromised
Resolution:
Reset the device. If the problem persists, replace
the Meter Body.
MDU/DAC
compensation fault
Possible causes:
This status is caused by one of the following
problems:
• DAC SPI fault
• DAC PEC fault
• DAC Temperature above 140C
• DAC VLOOP (loop voltage)low
• DAC control word write fault
Resolution:
Verify the environment temperature is within
specification. Take steps to insulate Meter Body
from temperature source.
If problem persists, replace Electronics Module.
Suspect input
Possible causes:
Pressure, Meter Body Temperature and/or Static
Pressure input are extremely out of range such
that the value is suspect.
Resolution:
Verify that all inputs are within specifications.
Reset the device. If the problem persists, replace
the Meter Body.
Characterization prom
fault or bad checksum
Possible causes:
Sensor characterization is corrupt or
there is a Sensor firmware failure
Resolution:
Reset the device. If the problem persists, replace
the Meter Body.