Description of instrument
SPECTRO XEPOS — 19.01.2017 — 5
1 Description of instrument
1.1 Description
Designation: SPECTRO XEPOS
Model: XEP05
Type: 76004852
1.2 Function
X-rays excite the atoms of the sample, causing them to emit radiation. This
radiation is measured by a semiconductor detector.
To achieve a higher sensitivity, the exciting radiation can be optimized by using X-
ray optical elements or filters.
The instrument comes with a prepared analysis method. Data are already stored
in the instrument's memory. The measured values are compared with these data.
After the measurement is complete, the results of a sample relating to an unknown
composition are displayed on the screen.
The sample material may be solid, liquid or in powder form, see Chapter "How to
measure different samples".
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