YOKOGAWA DL850E User Manual

App-17
IM DL850E-03EN
Appendix
1
2
3
4
5
6
App
Index
16-CH Temperature/Voltage Input Module
Rate at Which Data Is Written to the Acquisition Memory
Number of Sub Channels Used 1 to 16
Data Update Period Setting 100 ms 300 ms 1 s 3 s
Main Channel Sample
Rate Setting (S/s)
100 M 100 k 100 k 100 k 100 k
50 M 100 k 100 k 100 k 100 k
20 M 100 k 100 k 100 k 100 k
10 M 100 k 100 k 100 k 100 k
5 M 100 k 100 k 100 k 100 k
2 M 100 k 100 k 100 k 100 k
1 M 50 k 50 k 50 k 50 k
500 k 20 k 20 k 20 k 20 k
200 k 10 k 10 k 10 k 10 k
100 k 5 k 5 k 5 k 5 k
50 k 2 k 2 k 2 k 2 k
20 k 1 k 1 k 1 k 1 k
10 k 500 500 500 500
5 k 200 200 200 200
2 k 100 100 100 100
1 k 50 50 50 50
500 20 20 20 20
200 10 10 10 10
100 5 5 5 5
50 2 2 2 2
20 1 1 1 1
10 – – – –
5 – – – –
: Some data will not be updated. If this occurs, previous data is displayed consecutively.
If you set the sample rate (the main channel sample rate setting) of the DL850E/DL850VE to a rate
that exceeds the data update period, all data within the sub channel data update interval will be the
same.
Appendix 2 Relationship between the Main Channel Sample Rate, Sub Channel Data Update Rate, and Acquisition Memory Writing Rate

YOKOGAWA DL850E Specifications

General

Brand	YOKOGAWA
Model	DL850E
Category	Test Equipment
Language	English