1. Connect the test set for three phase voltage injection (A, B, C) or residual voltage
injection (N) to the appropriate IED terminals. This is dependent on how the IED is
fed from the CT .
2. Increase the injected zero sequence current and note the trip value (pickup value) of
the studied step of the function.
3. Decrease the current slowly and note the reset value.
4. Connect a trip output contact to a timer.
5. Set the injected current to 200 % of the trip level of the tested stage, switch on the
current and check the time delay.
Low current criteria
Procedure
1. Connect the test set for three phase current injection to the appropriate IED
terminals.
2. Inject a symmetrical three phase current larger than the set value PU_37
3. Decrease the injected current in phase A and note the trip value (pickup value) of the
studied step of the function.
4. Increase the current slowly and note the reset value.
5. Connect a trip output contact to a timer.
6. Decrease the injected current stepwise to 50 % of the trip level and check the time
delay.
7. Repeat steps 3 – 6 for phases B and C.
11.3.4.2 Completing the test
Continue to test another function or end the test by changing the test mode setting to
disabled. Restore connections and settings to their original values, if they were changed
for testing purposes.
11.4 Impedance protection
11.4.1 Distance protection zones, quadrilateral characteristic
ZMQPDIS (21)
Prepare the IED for verification of settings outlined in Section
"Preparing the IED to
verify settings".
Section 11 1MRK 504 165-UUS -
Testing functionality by secondary injection
112 Transformer protection RET670 2.2 ANSI
Commissioning manual
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