11.4.14 Phase preference logic PPLPHIZ
Prepare the IED for verification of settings outlined in Section
"Preparing the IED to
verify settings".
The Phase preference logic function PPLPHIZ is tested with a three-phase testing
equipment for distance protections. PPLPHIZ is tested in co-operation with the Distance
protection zone, quadrilateral characteristic function ZMQPDIS (21). The distance
protection and the phase preference logic shall be set to values according to the real set
values to be used. The test is made by means of injection of voltage and current where the
amplitude of both current and voltage and the phase angle between the voltage and current
can be controlled.
During the test the following binary signals (outputs) shall be monitored:
• Trip signal from distance protection
• Trip signal from phase preference logic
1. Connect the test set for injection of voltage and current.
2. Inject voltages and currents corresponding to a phase-to-phase to ground fault within
zone 1 of the distance protection function. In the test one of the current inputs (one of
the faulted phases) is disconnected. The remaining current is the fault current out on
the protected line. All combinations of two phase-to-ground faults with one phase
current are tested. The result shall be according to table 32. It should be checked that
the fault will give phase-to-phase voltage, phase-to-ground voltage, zero-sequence
voltage and phase current so that the conditions set for the logic are fulfilled.
Table 32: Operation at different combinations of faults and operation mode
OperMode
Fault type/Faulted phase current to the IED
A_BG/IA A_BG/IB B_CG/IB B_CG/IC C_CG/IA C_AG/IC
No Filter Trip Trip Trip Trip Trip Trip
No Pref Trip Trip Trip Trip Trip Trip
1231c Trip No Trip Trip No Trip No Trip Trip
1321c No Trip Trip No Trip Trip Trip No Trip
123a Trip No Trip Trip No Trip Trip No Trip
132a Trip No Trip No Trip Trip Trip No Trip
213a No Trip Trip Trip No Trip Trip No Trip
231a No Trip Trip Trip No Trip No Trip Trip
312a Trip No Trip No Trip Trip No Trip Trip
321a No Trip Trip No Trip Trip No Trip Trip
Section 11 1MRK 504 165-UUS -
Testing functionality by secondary injection
172 Transformer protection RET670 2.2 ANSI
Commissioning manual