11.6.6 Loss of voltage check LOVPTUV (27)
Prepare the IED for verification of settings outlined in Section
"Preparing the IED to
verify settings".
11.6.6.1 Measuring the trip limit of set values
1. Check that the input logical signals BLOCK, CBOPEN and BLKU are logical zero.
2. Supply a three-phase rated voltage in all three phases and note on the local HMI that
the TRIP logical signal is equal to the logical 0.
3. Switch off the voltage in all three phases.
After set tTrip time a TRIP signal appears on the corresponding binary output or on
the local HMI.
Note that TRIP at this time is a pulse signal, duration should be
according to set tPulse.
4. Inject the measured voltages at rated values for at least set tRestore time.
5. Activate the CBOPEN binary input.
6. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
7. Inject the measured voltages at rated values for at least set tRestore time.
8. Activate the BLKU binary input.
9. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
10. Reset the BLKU binary input.
11. Inject the measured voltages at rated values for at least set tRestore time.
12. Activate the BLOCK binary input.
13. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
14. Reset the BLOCK binary input.
11.6.6.2 Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to
Disabled. Restore connections and settings to their original values, if they were changed
for testing purposes.
Section 11 1MRK 504 165-UUS -
Testing functionality by secondary injection
222 Transformer protection RET670 2.2 ANSI
Commissioning manual
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