6TAENG201-1E
TOTAL ACCESS 3000/3010
ENG-201
Page 32 of 32
© 2002, ADTRAN, Inc. Total Access
®
3000/3010 System Manual
Figure 16. Wire-wrap Pins for Digital Test Access
T
R
T1
R1
P23/P22
DSX1
TEST
ACCESS
S
S
DSX-1 Input
To Shelf
DSX-1 Output
From Shelf
Shield
Shield
1.8.2 Digital Loop Test Access
Digital test access is provided through six wire-wrap pins (labeled DSX -1Test Access
and located at P23/P22) on the backplane of the system. See Figure 16.
Digital test access in a system is provided through multiplexers incorporating this
feature. A multiplexer supporting digital test access provides a DSX-1 network
interface derived from an access module’s interface delivered to the digital test access
wire-wrap pins. Digital test access is engaged with commands issued through the
system’s SCU.
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