Ametek UCS 200N .2 Series - Test Routine as Per ISO 7637; Burst Generation

AMETEK CTS UCS 200N
Manual for Operation V 2.41 18 / 54
4.5.4.
Test Routine as per ISO 7637
The display shows a list of test levels as per the standards ISO 7637.
STANDARD TEST ROUTINES
F3 : Pulse 3a -150V ISO 7637 / 12V
F4 : Pulse 3a -200V ISO 7637 / 24V
F5 : Pulse 3b +100V ISO 7637 / 12V
F6 : Pulse 3b +200V ISO 7637 / 24V
F1
F2
F3
F4
F5
F6
F7
Select the recommended test level by pressing the function key Fx and start the test immediately.
4.6.
Burst generation
As per ISO 7637 the test pulses 3a and 3b are defined as follows:
V
t
td
tr
10%
50%
90%
100%
V
S
Definition of a single pulse
V
t
t4
V
S
0
V
B
t1
t5
Definition of the burst
ISO 7637 3a
ISO 7637 3b
Parameter
12V System
24V System
12V System
24V System
VS
0V - -150V
0V - -200V
0V - +100V
0V -+ 200V
Ri
50
50
50
50
td
0.1s
0.1s
0.1s
0.1s
tr
5ns
5ns
5ns
5ns
t1
100s
100s
100s
100s
t4
10ms
10ms
10ms
10ms
t5
90ms
90ms
90ms
90ms
Discharge switch:
The discharge switch is a highly reproducible semiconductor switch. Spike frequencies up to 200kHz are by a
factor of 20 higher than recommended in the actual standards. This means of course that also the pulse energy
would be 20 times higher.