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6.4.3 Create test signal at local output
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Certain device types require an input signal as test pulse to detect a cross fault of the two input
channels. By means of the logical device SF_OUT_local_testpulse the programmer can create a test
signal at a local output.
To create a test signal at a local output:
► Add logical device "SF_OUT_loal_testpulse" to the project tree
(→ Add logical device to the project tree (→ S. 35)
The parameters of the test pulse are firmly set; there are no additional configuration options
(→ SF_OUT_local_testpulse (→ S. 266)).
>
6.4.4 Remove safe local device from project
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To completely remove a safe device added to the local I/O interface the 2 instances of the logical
device must be deleted separately from the project tree.
1 Remove logical device from the standard area
► Mark logical device in standard area of device tree.
► Select [Edit] > [Delete].
> CODESYS removes the logical device from the standard area.
2 Remove logical device from the safety area
► Mark logical device in the safety extension area of the device tree.
► Select [Edit] > [Delete].
> CODESYS removes the logical device from the safety extension area.
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