Keithley DAQ6510

Section
7: Scanning resistors using 4W measurement DAQ6510 Data Acquisition / Multimeter System
User's Manual
7-8 DAQ6510-900-01Rev. A / April 2018
Test results
The table below compares the values of scanned DUTs using 4-wire and 2-wire measurement
methods with the six resistors listed in the Instrument and Device Connection section.
The data provided in each cell of the table is the average of 100 scans.
Nominal
value (Ω)
Four-wire measurement
with offset compensation
(Ω)
Four-wire measurement
with NO offset
compensation (Ω)
Two-wire measurement
(Ω)
100
98.3242
98.3206
98.5831
68
67.9920
68.0080
67.2703
10
10.00998
10.00141
10.28680
2.2 2.20413 2.20588 2.51011
0.5
0.555823
0.559395
0.84131
0.2
0.221831
0.221796
0.53091