In this section:
Introduction .............................................................................. 5-1
Equipment required .................................................................. 5-1
Device connections .................................................................. 5-2
Thermocouple temperature scanning ....................................... 5-3
Introduction
This application example demonstrates how to use the DAQ6510 to log thermocouple-based
temperature measurement scans, using internal cold-junction compensation (CJC) correction, over a
24-hour period.
This type of test is typically performed when a device under test (DUT) is placed in an environmental
chamber and exposed to extreme conditions. The system captures data at different locations on the
DUT. The data is then exported from the DAQ6510 to a computer where a thermal profile is
generated. This thermal profile provides designers and consumers with a thorough understanding of
the thermal operating characteristics of their device or product.
Equipment required
• One DAQ6510
• One Model 7700 20-channel differential multiplexer module
• One computer set up for communication with the instrument
• Ten Type K thermocouples
• One USB flash drive
• One device or component to be tested
Section 5
Scanning temperature using thermocouples