2400 Series SourceMeter
®
User’s Manual Sweep Operation 10-13
SML 001 — Compliance Test
• Limit 1 test – Fail if in compliance, branch to source memory location 005 for
“pass” condition.
• Summary – Limit 1 test is configured such that if the diode is installed correctly in
the test fixture, it will fail the compliance test and operation will proceed to the
tests at memory locations 002, 003, and 004. If the diode is installed backwards, it
will pass the compliance test, and operation will branch around locations 002, 003,
and 004 to perform the tests at locations 005, 006, and 007. Source Memory Loca-
tion 002 - Forward Voltage Test (diode installed correctly).
SML 002 — Forward Voltage Test
• Source I, Measure V.
• Limit 2 test – Min/max limits for voltage reading.
• Summary – The voltage measurement and the result of the test (pass or fail) is
stored in the buffer.
SML 003 — Reverse Breakdown Test
• Source -I, Measure V.
• Limit 2 test – Min/max limits for voltage reading.
• Summary – The voltage measurement and the result of the test (pass or fail) is
stored in the buffer.
SML 004 — Leakage Current Test
• Source -V, Measure I.
• Limit 2 test – Min/max limits for current reading.
• Summary – The current measurement and the result of the test (pass or fail) is
stored in the buffer.
SML 005 — Forward Voltage Test
• Source -I, Measure V.
• Limit 2 test – Min/max limits for voltage reading.
• Summary – This test is the same as the test at memory location 002, except the
source current is reversed to properly bias the diode that was installed backwards.
SML 006 — Reverse Breakdown Test
• Source +I, Measure V.
• Limit 2 test – Min/max limits for voltage reading.
• Summary – This test is the same as the test at memory location 003, except the
source current is reversed to properly bias the diode that was installed backwards.
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