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Mitutoyo MF Series User Manual

Mitutoyo MF Series
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No. 99MBA091A
3-8
3.7 Selecting the Illumination Method
Select the appropriate illumination method depending on the type of workpiece.
3.7.1 Transmitted illumination
Used for the contour measurement and inspection. A telecentric system
(*
1
is employed.
The aperture diaphragm knob for transmitted illumination enables to adjust the brightness
and obtain the optimal aperture when measuring cylindrical workpieces. There are
continuous illumination intensity settings available. A maximum of two filters can be
mounted.
TIP
(*1) What is telecentric system?・・・・Illumination which placed the optical system so that
the image center size may not change by the image growing faint, even if the focus
deviates in the optic axis direction. The magnification error by the focusing does not
occur.
3.7.2 Vertical reflected illumination
Used for surface measurement and inspection. (The surface should not be excessively
rough). A Koehler system
(*2)
is employed and its advantages are fully utilized when
measuring the surface of mirror finish workpiece.
TIP
(*2) What is Koehler system?・・・・Illumination which placed the optical system so
that the illumination light (image) is not directly imaged on the observation plane
and the whole observation range is evenly irradiated by the uniform parallel light
with high brightness.
3.7.3 Simultaneous use of transmitted and vertical reflected illumination
The transmitted and vertical reflected illumination modes or the transmitted and oblique
reflected illumination modes can be used simultaneously. This enables to measure the
contour and surface feature of workpiece at the same time.

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Mitutoyo MF Series Specifications

General IconGeneral
BrandMitutoyo
ModelMF Series
CategoryMicroscope
LanguageEnglish

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