NXP Semiconductors MPC5777M - Page 51

Electrical characteristics
MPC5777M Microcontroller Data Sheet, Rev. 6
NXP Semiconductors 51
Figure 13. Test circuit
Table 25. Internal RC Oscillator electrical specifications
Symbol Parameter Conditions
Value
Unit
Min Typ Max
f
Target
CC IRC target frequency — — 16 — MHz
f
var_noT
CC IRC frequency variation
without temperature
compensation
T < 150
o
C–8 — 8 %
f
var_T
CC IRC frequency variation with
temperature compensation
T < 150
o
C–3 — 3 %
f
var_SW
1
1
IRC software trimmed accuracy is performed either with the CMU_0 clock monitor, using the XOSC as a reference or
through the CCCU (CAN clock control Unit), extracting reference clock from CAN master clock. Software trim must be
repeated as the device operating temperature varies in order to maintain the specified accuracy.
CC IRC software trimming
accuracy
Trimming
temperature
–1 — 1 %
f

IRC Software trimming step — -48 — +40 kHz
T
start_noT
CC Startup time to reach within
f
var_noT
No trimming — — 5 µs
T
start_T
CC Startup time to reach within
f
var_T
Factory
trimming
already applied
— — 120 µs
I
AVDD5
CC Current consumption on 5 V
power supply
After T
start_T
— — 400 µA
I
DVDD12
CC Current consumption on 1.2 V
power supply
After T
start_T
— — 175 µA
V
+
-
A
I
XTAL
Bias
Current
Comparator
OFF
VSSOSC
XTAL
EXTAL
VSS
PCB
GND
Tester
ALC
Z = R + jL
Conditions
VEXTAL=0 V
VXTAL=0 V
ALC INACTIVE
VDDOSC