Tegam 1750 - Measurement Times

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1-7
INSTRUMENT DESCRIPTION
RANGE REFERENCE CURRENT
1 A 100 mA 10 mA 1 mA 100 μA 10 μA 1 μA 100 nA
2 mΩ
.004%rdg
+1 count
20 mΩ
.004%rdg
+.5 counts
.004%rdg
+1 count
200 mΩ
.002%rdg
+.1 counts
.004%rdg
+.5 counts
2 Ω
.002%rdg
+.1 counts
.004%rdg
+.5 counts
20 Ω
.002%rdg
+.1 counts
.004%rdg
+.5 counts
200 Ω
.002%rdg
+.1 counts
.002%rdg
+.1 counts
.004%rdg
+.5 counts
2 kΩ
.002%rdg
+.1 counts
.002%rdg
+.1 count
20 kΩ
.002%rdg
+.1 count
.002%rdg
+.1 counts
200 kΩ
.002%rdg
+.1 counts
2 MΩ
.008%rdg
+.5 counts
20 MΩ
.008%rdg
+.5 counts
Table 1.4: Table of Temperature Coefficients
+/- Temperature Coefficient / °C
(0-18 °C & 28-50 °C; 32-64.4 °F & 82.4-122 °F)
MEASUREMENT TIMES
READING RATE
TIME TO FIRST READING
FAST MODE
10ms
100 Readings/s
12 ms
DELAYED MODE
DELAY=1 ms
36 ms
27 RDG/s
38 ms
DELAY=5 ms
45 ms
22 RDG/s
47 ms
DELAY=10 ms
55 ms
18 RDG/s
57 ms
Table 1.5: Measurement Times
Table 1.5 provides approximations of measurement times and reading rates for delayed and fast modes.
Note that the time to first reading is longer than subsequent readings. Examples are provided for various
delay settings. The Delayed Mode Measurement Time is calculated by the following equation:
Where the Line Period is 1/f, f = (50 or 60 Hz) and the Programmed Delay Time may range from 1mS
to 250 ms. The Process Time is the time required to process the read data and is equal to about 1.9
ms.
Delayed Mode
Measurement
=
2 X (Line Period + Programmed Delay + Process Time)