Index
Index-11
swept edit list menu, 7-17
swept edit subsweep menu
, 7-17
swept list mode
calibrate
, 1-70
characteristics of the filter
, 1-68
device under test, connect
, 1-67
measure
, 1-70
measurement parameters
, 1-68
stepped list mode
, 1-67
to test a device
, 1-67
swept list mode, using
, 5-10
swept RF/IF conversion loss, high
dynamic range
, 2-20
switch protection, source
attenuator
, 7-13
SWR format
, 7-28
SWR/return loss
, 2-50
synthesized source, built-in
, 7-3
system
bandwidth, changing
, 5-16
bandwidth, widening
, 5-12
system controller mode
, 7-79
system operation
, 7-3
built-in synthesized source
, 7-3
built-in test set
, 7-4
microprocessor
, 7-4
receiver block
, 7-4
required peripheral equipment
,
7-4
systematic errors
, 7-41
T
taking care of microwave
connectors
, 5-3
talker/listener mode
, 7-79
target amplitude, searching for
,
1-40
temperature drift
, 5-5
terminology, TRL
, 7-68
test
bandwidth
, 1-92–1-97
ripple limit
, 1-81–1-91
test port coupling
, 7-10
test port input power, increasing
,
5-15
test sequencing
, 1-98
changing the sequence title
,
1-103
clearing a sequence from
memory
, 1-102
creating a sequence
, 1-98
editing a sequence
, 1-100
generating files in a loop counter
example
, 1-116
in-depth sequencing
information
, 1-105
inserting a command
, 1-101
limit test example sequence
,
1-118
loading a sequence from a disk
,
1-104
loop counter example sequence
,
1-115
modifying a command
, 1-101
naming files generated by a
sequence
, 1-103
printing a sequence
, 1-105
purging a sequence from a disk
,
1-104
running a sequence
, 1-100
stopping a sequence
, 1-100
storing a sequence on a disk
,
1-104
using to test a device
, 1-114
test set, built-in
, 7-4
testport output power
, 5-7
text file, saving measurements as
a
, 4-44
thru, manual
, 6-60
time delay, decreasing
, 5-9
time domain bandpass mode
, 3-4,
3-12
adjusting the relative velocity
factor
, 3-12
reflection measurements using
bandpass mode
, 3-12
transmission measurements
using bandpass mode
, 3-14
time domain low pass impulse
mode
, 3-4
time domain low pass mode
, 3-15
fault location measurements
using low pass
, 3-18
minimum allowable stop
frequencies
, 3-16
reflection measurements in time
domain low pass
, 3-16
setting frequency range for time
domain low pass
, 3-15
transmission measurements in
time domain low pass
, 3-19
time domain low pass step mode
,
3-4
time domain measurements,
introduction
, 3-3
forward transform mode
, 3-4
time domain bandpass mode
,
3-4
time domain low pass impulse
mode
, 3-4
time domain low pass step
mode
, 3-4
time stamp
, 4-33
title
, 1-106
title, display
, 1-11
titling the displayed
measurement
, 4-32
to produce a time stamp
, 4-33
trace math operation
, 7-7
trace noise, reducing
, 5-16
tracking
, 7-41
tracking the amplitude
, 1-41
tracking, amplitude and phase
,
2-39
transform
, 7-8
transforming CW time
measurements into the
frequency domain
, 3-22
forward transform
measurements
, 3-22
transmission measurements in
time domain low pass
, 3-19
interpreting the low pass step
transmission response
horizontal axis
, 3-20
interpreting the low pass step
transmission response
vertical axis
, 3-20
measuring separate
transmission paths through
the test device using low
pass impulse mode
, 3-20
measuring small signal
transient response using
low pass step
, 3-19
transmission measurements
using bandpass mode
, 3-14
interpreting the bandpass
transmission response
horizontal axis
, 3-14
interpreting the bandpass
transmission response
vertical axis
, 3-14
transmission measurements,
response and isolation error
correction
, 6-17
transmission measurements,
response error correction
,
6-14
transmission response
measurements, making
, 3-5
TRL calibration, performing
, 6-52
TRL error correction
assigning standards to various
TRL classes
, 6-51
label the calibration kit
, 6-51
label the classes
, 6-51
performing the TRL calibration
,
6-52
TRL error-correction
, 6-50
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