82 Agilent 1260 Infinity RID User Manual
4 Using the Refractive Index Detector
Checking Baseline Noise and Drift
Evaluation
For the Instant Pilot Rescale the plot and measure the baseline noise and drift
on the screen. If a printer is configured for the instrument the plot can be
printed by pressing the m key and selecting Print Plot.
The following values are calculated automatically by the Agilent ChemStation.
• Noise (ASTM): The short term noise in nRIU based on ASTM method
E-1303-95 Practice for Refractive Index Detectors used in Liquid
Chromatography using 0.5 minute segments.
• Wander: The long term noise in nRIU based on ASTM method E-1303-95
Practice for Refractive Index Detectors used in Liquid Chromatography
using 0.5 minute segments.
• Drift: The drift in nRIU/hour based on ASTM method E-1303-95 Practice
for Refractive Index Detectors used in Liquid Chromatography measured
over 20 minutes.
Factors that will affect the baseline stability include:
• Variations in the optics or eluent temperature
• Pressure fluctuations in the sample cell
• The quality of the water used
• Air bubbles in the flow cell
See “Refractive Index Detector Control” on page 66.
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