Cisco ONS 15454 - Test Access Mode Definitions

2-15
Cisco ONS SONET TL1 Command Guide, R6.0
Chapter 2 Procedures and Provisioning
2.2.9 Test Access Mode Definitions
Example 2-16 ED-STS1::STS-1-1:TACC=4; Creates TAP with STS-1-1 and STS-1-2 through NE1. TAP
number assigned is 4.
Example 2-17 CONN-TACC-STS1::<AID A or B>:102::4:<MD> Connects TAP 4 to the circuit.
Note The I and J connections above are TAPs in Figure 2-3, but normal connections in the Figure 2-4
configuration.
2.2.9 Test Access Mode Definitions
The following diagrams show what the different test access modes <MD> refer to. Figure 2-5 shows a
circuit with no access (dual FAD TAP) and Figure 2-6 shows a circuit with no access (single FAD TAP),
followed by all the modes. The QRS can be generated by an outside source, for example, the empty
connection of the BRTU.
MONE, MONF, and MONEF access modes are non-service effecting and can be applied to an IS (in
service) port state.
LOOPE, LOOPF, SPLTE, SPLTF, SPLTEF, SPLTA, SPLTB, and SPLTAB access modes are intrusive and
can be applied only to a circuit/port that is in the OOS_MT (out of service, maintenance) port state. The
NE will change the state of the circuit under test to OOS_MT during the period of TACC and restore it
to the original state when the connection between the TAP and the circuit is dropped.
Figure 2-5 Circuit With No Access (Dual FAD TAP)
Figure 2-6 Circuit With No Access (Single FAD TAP)
61106
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)
102052
A
E
B
F
"Mapped"
AID
AID
Single FAD TAP
(same bandwidth
as circuit accessed)