2-19
Cisco ONS SONET TL1 Command Guide, R6.0
 
Chapter 2      Procedures and Provisioning
2.2.9  Test Access Mode Definitions
Figure 2-15 SPLTF Access Dual TAP
2.2.9.6 SPLTEF
Split EF (SPLTEF) for T1 (DS1 HCDS) splits both the A and B paths, connects the E side of the accessed 
circuit to FAD1 and the dual facility access digroup (DFAD) pair, and connects the F side to the FAD2 
of the same DFAD pair (Figure 2-16). 
SPLTEF for T3 (DS3 HCDS) splits both the A and B paths and connects the E side of the accessed circuit 
to the odd pair of the FAP and the F side to the even pair of the FAP.
Figure 2-16 SPLTEF Access Dual TAP
2.2.9.7 LOOPE
Loop E (LOOPE) splits both the A and B paths, connects the incoming line from the E direction to the 
outgoing line in the E direction, and connects this looped configuration to the FAD (Figure 2-17 and 
Figure 2-18). Loop E and F modes are basically identical to the SPLT E and F modes except that the 
outgoing signal is the incoming signal and not the signal from the remote test unit (RTU).
Note QRS is not supported on the ONS 15454, ONS 15327, and ONS 15310-CL. The connection will remain 
as is. The ONS 15600 inserts AIS instead of QRS.
61111
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)
BB
61112
A
E
B
F
"Mapped"
AID
AID
Dual-FAD TAP
(2 times the bandwidth
of the circuit accessed)