Tektronix 465M - Semiconductor Lead Configurations

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AIR

FORCE

T033A1-13-496-1

NAVELEX

0969-LP-170-0010

Maintenance

Instructions

LARGE

INTEGRATED CIRCUITS

jk.

SOURCE

AND DRAIN DESIGNATION REVERSED

FROM

STANDARD

TO MATCH SCHEMATIC DIAGRAM.

Figure

5-3.

Semiconductor

lead

configurations.

5-31

Table of Contents

Table of Contents5
List of Illustrations7
Common-Mode8
Delayed-Sweep8
Sweep8
Vertical8
- Ground the Instrument11
- Safety Summary11
- Safety Warning Identification11
And Indicators13
General Information13
Introduction13
- Equipment13
- Use of Warning, Caution and Note Symbols13
- Electrical Characters14
- Leading Particulars14
Cascaded Operation15
- Accessories20
Rackmounting Accessory23
- Carrying Handle Positioning25
- Faceplate Filter Installation25
Grounding25
- Operating Voltage Selection25
- Power Cord25
- Preparation for Use and Shipment25
- Installation Instructions26
- Removal Instructions26
- Operating Temperature27
- Preparation for Shipment27
- Delay Line Driver and Delay Line29
Operation Instructions29
- Basic Circuit29
- Horizontal29
- Vertical29
- Main Module32
  - Gate out32
- Low37
Main Module41
- Axis Amplifier41
- Crt51
Intensity51
- BEAMFINDER Z-Axis Amplifier Operation52
- Crt Circuit52
- High Voltage Oscillator52
- High Voltage Multiplier53
- High Voltage Rectifier53
- High Voltage Regulator53
- Horizontal Amplifier54
- DC Restorer55
- Theoretical DC Restorer Waveform55
- Low Voltage Power Supplies56
- Multivibrator56
- Output Amplifier56
- Primary Circuit56
- Functions of Controls, Connectors and Indicators57
- Overcurrent Protection57
- Calibrator58
Graticule58
Probe58
- Input59
Trace Rotation58
Coaxial Cables63
Loading Effect of Input Connections63
Operating Considerations63
- Signal Connections63
- Cascaded Operation64
- Common Mode Rejection64
- Delayed Sweep Magnification64
- Initial Instrument Turn-On65
- Magnified Sweep Triggered after Delay65
- Initial Control Settings66
- Intensity Adjustment66
Preliminary Adjustments66
- Trace Rotation Adjustment66
- Beam Finder67
- Normal Operation67
- Probe Compensation67
- Horizontal Deflection System68
- Intensity and Focus68
- Vertical Deflection System68
- Delayed Sweep69
- Intensified Sweep69
- Mixed Sweep69
- Normal Trigger69
- Dual Trace Phase Difference Measurement70
- Differential Time Measurement71
- High Resolution Phase Difference Measurement71
- Rise Time Measurement71
- Time Duration and Frequency Measurement71
- Maintenance Instructions75
- Operational Checkout75
- Vertical Deflection Factor Accuracy76
- Variable Vertical Deflection Factor Range77
- X Gain77
- Channel Position Effect78
- Trigger View Gain78
- Cascaded Sensitivity and Bandwidth80
- And CH81
  - Trigger Jitter82
  - Trigger Level Range82
  - 25 Mhz Triggering83
  - 100 Mhz Triggering85
  - Low Frequency Trigger86
  - Z-Axis Input87
  - Sweep Rate Accuracy88
  - Magnified Sweep Accuracy89
  - Variable Sweep Rate Range89
  - Differential Time Measurement Accuracy91
  - Delay Time Jitter92
  - +Gate Outputs and a Trigger Holdoff93
  - Calibrator Output94
  - Chopped Mode Repitition Rate94
  - Preventive Maintenance94
  - External Cleaning, Except Crt Faceplate and Filter95
  - External Inspection95
  - External Inspection Checklist95
  - External Preventive Maintenance95
  - Cabinet Removal96
  - Internal Cleaning96
  - Internal Preventive Maintenance96
  - TIME/DIV Switch Cleaning96
  - Circuit Board Illustrations97
  - Diagrams97
  - Internal Inspection Checklist97
  - Troubleshooting Aids97
  - Component Value Identification98
  - Troubleshooting Chart99
  - Check Associated Equipment104
  - Check Control Settings104
  - Troubleshooting Techniques104
  - Visual Check104
  - Semiconductor Lead Configurations105
  - Cabinet Top and EMI Shield Removal and Replacement106
  - Calibration and Checkout after Repair106
  - Component Removal, Replacement, and Disassembly106
  - Interconnecting Cables and Connectors107
  - Rear Panel Assembly Removal and Replacement107
  - Cabinet Bottom Removal and Replacement108
  - Horizontal Module Removal108
  - Vertical Module Removal108
  - Cabinet Bottom Removal109
  - Cathode Ray Tube Removal109
  - Interface Board Removal110
  - Shaft-Knob Removal110
  - TIME/DIV Switch Disassembly113
  - Trigger Board Removal and Replacement113
  - Gratitude Illumination Board Removal and Replacement114
  - Horizontal Board Removal and Replacement114
  - Source and Coupling Switch Disassembly114
  - Sweep Board Removal and Replacement114
  - Hybrid IC Removal115
  - VOLTS/DIV Attenuator Disassembly115
  - BNC Connector117
  - Compensation Box117
  - Probe Disassembly and Repair117
  - Probe Head117
  - Light-Emitting Diode Replacement118
  - +32 Volt Power Supply119
  - Calibration119
  - Crt Bias119
  - Preliminary Calibration Set-Up119
  - Y-Axis Alignment120
  - Z-Axis Compensation120
  - Channel 2 Low Frequency Compensation121
  - DC Balance121
  - Geometry121
  - Vertical Gain121
  - Channel 1 Low Frequency Compensation122
  - Vertical Adjustment Locations122
  - High-Frequency Compensation123
  - Trigger Hysteresis and Slope Centering124
  - External Trigger Centering125
  - Sweep Start-Stop125
  - Horizontal Gain126
  - Horizontal Module Chassis126
  - Magnifier Registration127
  - Sweep Adjustment Locations127
  - Sweep Timing127
  - 5 Nanosecond Timing Adjustment Locations129
  - Arrangement131
  - Reference Designators131
  - Schematic Diagrams131
  - Symbols and Reference Designators131
  - Instrument Setup132
  - Test Oscilloscope Setup132
  - Voltage Conditions132
  - Waveforms and Voltage Test Conditions132
  - Schematic Symbols133
  - Illustrated Parts Breakdown Introduction135
  - Indention135
  - Maintenance Parts List Introduction135
  - Similar Assemblies135
  - Tektronix Part Numbering136
  - How to Use the Illustrated Parts Breakdown140
- Vertical151
- Capacitor, Fixed, Ceramic Dielectric167
- Airforce T033A1174
- Navelex 0969-Lp-170-0010174
- Ref175
- Usable on Code175
- 25W176
- Ohm, 5%, 25W176
- 125W177
- Ohm, 125W177
Rise Time80

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