28
TMS570LS0714
SPNS226E –JUNE 2013–REVISED NOVEMBER 2016
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Terminal Configuration and Functions Copyright © 2013–2016, Texas Instruments Incorporated
4.2.2.13 Test and Debug Modules Interface
Table 4-32. PZ Test and Debug Modules Interface
TERMINAL
SIGNAL
TYPE
RESET
PULL
STATE
PULL TYPE DESCRIPTION
SIGNAL NAME 100 PZ
nTRST 76 Input Pulldown Fixed, 100 µA JTAG test hardware reset
RTCK 80 Output – – JTAG return test clock
TCK 79 Input Pulldown Fixed, 100 µA JTAG test clock
TDI 77 I/O Pullup Fixed, 100 µA JTAG test data in
TDO 78 I/O Pulldown Fixed, 100 µA JTAG test data out
TMS 75 I/O Pullup Fixed, 100 µA JTAG test select
TEST 24 I/O Pulldown Fixed, 100 µA
Test enable. This terminal must be connected to ground
directly or via a pulldown resistor.
4.2.2.14 Flash Supply and Test Pads
Table 4-33. PZ Flash Supply and Test Pads
Terminal Signal
Type
Reset Pull
State
Pull Type Description
Signal Name 100
PZ
VCCP 96 3.3-V
Power
– – Flash external pump voltage (3.3 V). This
terminal is required for both Flash read and Flash
program and erase operations.
FLTP1 3 Input – – Flash Test Pins. For proper operation this
terminal must connect only to a test pad or not be
connected at all [no connect (NC)].
The test pad must not be exposed in the final
product where it might be subjected to an ESD
event.
FLTP2 4 Input – –
4.2.2.15 Supply for Core Logic: 1.2-V Nominal
Table 4-34. PZ Supply for Core Logic: 1.2-V Nominal
Terminal Signal
Type
Reset Pull
State
Pull Type Description
Signal Name 100
PZ
VCC 13 1.2-V
Power
– – Digital logic and RAM supply
VCC 21
VCC 30
VCC 32
VCC 61
VCC 88
VCC 99
4.2.2.16 Supply for I/O Cells: 3.3-V Nominal
Table 4-35. PZ Supply for I/O Cells: 3.3-V Nominal
Terminal Signal
Type
Reset Pull
State
Pull Type Description
Signal Name 100
PZ
VCCIO 6 3.3-V
Power
– – I/O Supply
VCCIO 28
VCCIO 60
VCCIO 85
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