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ANUAL
CONFIDENTIAL 02.9628.0010
7-Oct-97
3.1.1.3 Seven-Segment Display
The seven-segment display is initially used to display the test number (in
hexadecimal) for tests 1 thru 15. Error codes and results from these tests
are then displayed whenever they occur. Mechanics tests, multiple function
tests, and PSU test settings (tests 1 thru 15) all display their results as error
codes that could be multiple during each test.
Error codes are all preceded by the characters “Er” and followed by three
characters separated by decimal points. General error code format defines
the first character as the faulty assembly by indicating the main assembly
test number 1 thru F. The following two characters are the error type, that
for the PSU test also incorporates the parameter setting on failure. Some
error codes are followed by results that are preceded by a dash and are
unique to that test. In general, they are an absolute value arising from that
test, displayed in hexadecimal.
Remember:
•
Characters are always separated by a decimal (dot).
•
Lists of error codes are always separated by three scrolling bars before
the start of the list is rescrolled.
•
Tests above number 15 only produce results unique to those tests.
•
Scroll speeds of all displays are set by the scroll speed selectable with
test 40, the error history display.
3.1.2 Reset Tests
The reset tests are carried out immediately upon power-up. They test the
board ROM and RAM functionality. A failure is indicated by three solid
parallel bars causing the software to terminate. The pan and tilt functions
are then calibrated. Any errors detected here flag the offending mechanism
as unavailable for future use. The relevant error code/result is displayed
until further tests are selected. If no errors are discovered, then tests
already selected on the thumbwheel will run.
Detectable errors are as follows:
•
No encoder activity.
•
Illegal encoder activity.
•
Failure to reset to zero.
Note
: The head should not be manually impeded while calibrating as this
will upset the operation of future pan/tilt tests.
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