Wavetek 75 - Page 6

CONTENTS (Continued)
SECTION 5 CALIBRATION
SCOPE
................................ 5-1 ...........
..........................
FACTORY REPAIR .... ..... 5-1
REQUIRED TEST EQUIPMENT
... .................. 5-1
CALIBRATION
. . ...... ........ .............. 5-1
AMPLITUDE
..................... ........... 5-3
OFFSET
.................................... ...... 5-4
FREQUENCY
.................................. .... 5-5
OUTPUT WAVEFORM
RISE AND FALL TIME ................. 5-6
................ SUM IN ........................ 5-7
SECTION
6 TROUBLESHOOTING
6.1 FACTORY REPAIR
................................... 6-1
6.2 BEFORE YOU START
.................................. 6-1
6.2.1 Isolating a Problem
...................................... 6-1
6.2.2 Troubleshooting Dynamic Digital Circuits
.................... 6-3
6.3 TROUBLESHOOTING GUIDES
............................... 6-3
6.3.1 Power Supply ........................................... 6-3
6.3.2 Microprocessor and Main Memory
......................... 6-16
6.4 TROUBLESHOOTING
l NDlVlDUAL COMPONENTS ................. 6-20
6.4.1 Transistor
.......................................... 3-20
6.4.2 Diode
............................................ 6-20
6.4.3 Operational Amplifier
............................... 6-23
6.4.4 Field Effect Transistor (FET)
.............................. 6-20
................................
6.4.5 Capacitor .... 6-20
6.4.6 Logic Levels
........................................ 6-20
SECTION
7 PARTS LIST AND SCHEMATICS
7.1 DRAWINGS
....................................... 7-1
............................................. 7.2 ERRATA 7-1
7.3 ORDERING PARTS
................................. 7-1
APPENDIX
APPENDIX A AMERICAN STANDARD CODE FOR INFORMATION INTERCHANGE
(ASCII)
.................................................. A-1
APPENDIX B MODEL 75 QUICK REFERENCE GUIDE ............................. B-1
Scans by ArtekMedia O 2006