MI 3125 / BT EurotestCOMBO Appendix C
80
Test parameters for RCD test and measurement
RCD sub-function test [RCDt, RCD I, AUTO, Uc].
Rated RCD residual current sensitivity I
N
[10 mA, 30 mA, 100 mA, 300
mA, 500 mA, 1000 mA].
RCD type AC, A, F, B*, B+* starting polarity [ , , , ,
*, *
],
selective
Multiplication factor for test current [½, 1, 2, 5 IN].
Conventional touch voltage limit [25 V, 50 V].
* Model MI 3125 BT
Notes:
Ulim can be selected in the Uc sub-function only.
Selective (time delayed) RCDs and RCDs with (G) - time delayed characteristic
demonstrate delayed response characteristics. They contain residual current
integrating mechanism for generation of delayed trip out. However, contact
voltage pre-test in the measuring procedure also influences the RCD and it takes
a period to recover into idle state. Time delay of 30 s is inserted before
performing trip-out test to recover
type RCD after pre-tests and time delay of
5 s is inserted for the same purpose for
type RCD.
Modification of the chapter 5.4.1
Contact voltage Uc
proportional to
Table C.1: Relationship between Uc and I
N
Technical specifications remain the same.
C.2.3 NO, DK, SW modification – IT supply system
C.2.3.1 Modification of chapter 4.2
Different instrument options can be set in the SETTINGS
menu, additional option is
added:
Selection of power supply system.