Metronics Quadra-Chek 200 - System Settings Step

Chapter 4 Programming
4-20
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NOTE
In this example, the clear features parameter is highlighted.In this example, the clear features parameter is highlighted.
In this example, the clear features parameter is highlighted.In this example, the clear features parameter is highlighted.
In this example, the clear features parameter is highlighted.
Step 4
Press the desired soft key.
Step 5
Press the finish key.
System settings step
The system settings step is a ‘snapshot’ of the QC200 settings at the time the
program was recorded. Parameters in the system settings step include:
• Targeting view on/off
• Select datum 1/ datum 2
• Probe
• Units
• Mode
Targeting view on/off
Targeting view indicates the location of feature points using a graphic display as
shown. Press the edit soft key to toggle targeting view on and off.
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NOTE
Users can press the Users can press the
Users can press the Users can press the
Users can press the
view soft keyview soft key
view soft keyview soft key
view soft key
to switch to targeting view to switch to targeting view
to switch to targeting view to switch to targeting view
to switch to targeting view
while a program is running. Select while a program is running. Select
while a program is running. Select while a program is running. Select
while a program is running. Select
targeting view ontargeting view on
targeting view ontargeting view on
targeting view on
to make to make
to make to make
to make
the targeting view the default display for a program.the targeting view the default display for a program.
the targeting view the default display for a program.the targeting view the default display for a program.
the targeting view the default display for a program.
Select datum 1/ datum 2
Use the select datum 1/ datum 2 system setting to select the desired datum for the
program. Press the edit soft key to toggle between datum 1 and datum 2.
Probe
Use the probe system setting to select the desired probe for the program. Press the
edit soft key to toggle between edge detection and crosshair probes.