C-8 Description of Self Test Items
buffer DDR (transmitting scan control frame), IQ buffer DDR (transmitting IQ data) and Gather
buffer DDR (collecting data).
Analysis to test failure
The drive goes wrong if the test result appears Error.
The connection error between FPGA and plug-in DDR occurs if the test result is FAIL.
Suggestion to failure test
Restart the device to perform the self test if the test result appears Error. It is necessary to restore
the device (OS+doppler) if Error re-appears.
It is recommended to replace engine board if the test result is FAIL.
C.1.19 Z0503 ATGC Function Test
Top test item
TRA AFE test mode
Test content
Control a channel to transmit 2 V waveform. Collect the waveform that AFE receives as setting
ATGC to max, min and medium value. Decide whether the amplitude of waveform changes as
ATGC increases according to the analysis on RMS value.
Analysis to test failure
The drive goes wrong if the test result appears Error.
The circuit of ATGC gain adjustment goes wrong if the test result is FAIL.
Suggestion to failure test
Restart the device to perform the self test if the test result appears Error. It is necessary to restore
the device (OS+doppler) if Error re-appears.
It is recommended to replace engine board if the test result is FAIL.
C.1.20 Z0601 MF FPGA and PHV ARM Interconnection Test
Top test item
Communication self test between PC Module and MF FPGA
Test content
Test whether UART communication between DSP FPGA and PHV ARM works well. Send the
order through PHV serial port drive, and re-read the data via the port.
Analysis to test failure
The drive goes wrong if the test result appears Error.
UART interconnection between FPGA and PHV ARM goes wrong if the test fails.
Suggestion to failure test
Restart the device to perform the self test if the test result appears Error. It is necessary to restore
the device (OS+doppler) if Error re-appears.
It is recommended to change PHV power supply board if the test result is FAIL.
C.1.21 Z0602 PHV Board CW Mode Test
Top test item
MF FPGA and PHV ARM interconnection test