Section 060-INDP-111 System Description 2-63
BMC II BISYNC Operation, Administration, and Maintenance Guide BMCB001 and up
receiver. Upon completion of transmission, the transmitter generates an
interrupt to the receiver to give control to the receiver, and to start receiver
completion. The receiver accepts all of the incoming bytes, echoes them, and
waits for the transmitter interrupt, to begin its completion. If a timeout occurs
during or after reception of all bytes, a reception error is generated.
There are two tests, manual and running. The manual test is initiated by
terminal input. During the manual test, the active processor sends a message
to the standby, waits for the message to return from the standby, and verifies
that the returned message is the same as the message originally sent.
If there is a discrepancy, the following error message is output to the terminal;
refer to the procedure for this message and perform the craftsperson activities
listed:
00 PIO TEST FAILED
The running test is performed for every occasion of messages being sent
across the PIO from active Processor to the standby Processor. The running
test consists of two operations. The first is an echo check. If the character
(byte) sent across the PIO is not the same as the one echoed back, the
following error message is output on the terminal:
00 PIO TEST FAILED
The second operation performed during the running test is the timeout test.
When a message is started, the time between the transmission of each byte
must not exceed a predetermined threshold.
If this threshold is exceeded, the following error message is output to the
terminal:
COMM DOWN TO STANDBY PROC
Communication Processor (CP) Testing Overview
The CP test function is used to verify the proper operation of various
functions that reside on the 56K Interface PCA. The test command takes the
form:
>CP TEST ACT (cr) - active processor
>CP TEST STDBY (cr) - standby processor.
The following paragraphs provide a general description of the CP test
command and a brief description of the various test functions incorporated in
the test function.
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