NXP Semiconductors MPC5746R - Data Retention Vs Program;Erase Cycles

Table 32. Flash memory module life specifications (continued)
Symbol Characteristic Conditions Min Typical Units
Blocks with 100,000 P/E
cycles.
20 — Years
Blocks with 250,000 P/E
cycles.
10 — Years
1. Program and erase supported across standard temperature specs.
2. Program and erase supported across standard temperature specs.
17.4 Data retention vs program/erase cycles
Graphically, Data Retention versus Program/Erase Cycles can be represented by the
following figure. The spec window represents qualified limits. The extrapolated dotted
line demonstrates technology capability, however is beyond the qualification limits.
Flash memory specifications
SPC5746R Microcontroller Data Sheet, Rev. 6, 06/2017
56 NXP Semiconductors