All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
Device failure is defined as: "If after exposure to ESD pulses, the device does not meet
the device specification requirements, which includes the complete DC parametric and
functional testing at room temperature and hot temperature. Maximum DC parametrics
variation within 10% of maximum specification."
Table 2. ESD ratings
Parameter Conditions Value Unit
ESD for Human Body Model (HBM)
1
All pins 2000 V
ESD for field induced Charged Device Model (CDM)
2
All pins 500 V
1. This parameter tested in conformity with ANSI/ESD STM5.1-2007 Electrostatic Discharge Sensitivity Testing
2. This parameter tested in conformity with ANSI/ESD STM5.3-1990 Charged Device Model - Component Level
6 Operating conditions
The following table describes the operating conditions for the device, and for which all
specifications in the data sheet are valid, except where explicitly noted.
The device operating conditions must not be exceeded in order to guarantee proper
operation and reliability.
NOTE
All power supplies need to be powered up to ensure normal
operation of the device.
Table 3. Device operating conditions
Symbol Parameter Conditions
Value
Unit
Min Typ Max
Frequency
f
SYS
Device operating frequency
1
T
J
-40 °C to 150 °C — — 200 MHz
Temperature
T
J
Operating temperature range -
junction
–40.0 — 150.0 °C
T
A
(T
L
to T
H
) Operating temperature range -
ambient
–40.0 — 125.0 °C
Voltage
V
DD_LV
External core supply voltage
2, 3
LVD/HVD enabled 1.2 — 1.32 V
LVD/HVD disabled
4, 5, 6
1.18 — 1.38
V
DD_HV_IO_MAIN
I/O supply voltage
7
3.5 — 5.5 V
Table continues on the next page...
Operating conditions
SPC5746R Microcontroller Data Sheet, Rev. 6, 06/2017
8 NXP Semiconductors
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