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Abov MC96F6432 Series - Page 327

Abov MC96F6432 Series
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MC96F6432
June 22, 2018 Ver. 2.9 327
5) ESD Test Method : I/O (Pin-to-Pin) Mode
I/O pins are zapped, pin by pin.
I/O pins which are not zapped are grounded.
All power pins (VDD and VSS) are floated.
6) ESD Class
HBM (Human-Body-Model) : 2
M.M. (Machine-Model) : B

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