Fluke 6060B - Page 4

TABLE
OF
CONTENTS, continued
SECTION
TITLE
PAGE
3-27.
Status
Signals
3-7
3-28.
DETAILED
CIRCUIT DESCRIPTIONS 3-8
3-29.
FRONT
SECTION, Al 3-8
3-30.
Display PCA, AlAl
3-9
3-37. Switch PCB, A1A2
3-9
3-38.
MODULE SECTION, A2 3-10
3-39.
Synthesizer PCA,
A2A1
3-10
3-50.
VCOPCA, A2A2
3-18
3-51.
Output PCA, A2A4
3-19
3-57.
Attenuator PCA,
A2A5 3-22
3-58. Controller
PCA, A2A7
3-23
3-67.
REAR SECTION, A3 3-25
3-68.
Power Supply PCA, A3A1
3-25
3-69.
Sub-Harmonic Reference (Part of A2AI)
3-26
3-70.
NON VOLATILE MEMORY A2A8
3-26
3-71. Power Circuit
3-26
3-
72. Memory Control
.
-
3-26
4
MAINTENANCE
4-1
4-
1.
INTRODUCTION
4-1
4-2.
SERVICE METHODS
4-1
4-3.
Fluke Service
4-1
44.
Module Replacement
4-1
4-5.
Parts
Replacement
4-1
4A
PERFORMANCE TESTS
4A-1
4A-1.
INTRODUCTION
4A-1
4A-2. TEST EQUIPMENT
4A-1
4A-3.
POWER-ON TEST
4A-3
4A4.
SYNTHESIS
TEST 4A-3
4A-5. HIGH-LEVEL
ACCURACY TEST
4A4
4A-6. MID-LEVEL ACCURACY TEST
4A-6
4A-7.
LOW-LEVEL
ACCURACY TEST
4A-7
4A-8.
ALTERNATE-LEVEL ACCURACY TEST 4A-8
4A-9. OUTPUT LEAKAGE TEST
4A-9
4A-10.
ALTERNATE OUTPUT LEAKAGE TEST
4A-10
4A-I1. HARMONIC
AND
SPURIOUS
TEST 4A-11
4A-12. MODULATION
TESTS
4A-12
4A-I3.
SWR
TESTS 4A-17
4B ACCESS
PROCEDURES
4B-1
4B-L
INTRODUCTION
4B-1
4B-2.
LOCATION
OF MAJOR ASSEMBLIES
4B-1
4B-3. ACCESS
INSTRUCTIONS
4B-I
4B4. Removing the
Front Section Assembly, A1 4B-1
4B-5.
Removing the Rear Section Assembly, A3
4B-2
4B-6.
Removing the Synthesizer Board, A2A1
4B-2
4B-7. Removing
the
Output Board, A2A4 4B-2
4B-8. Removing the Attenuator/ RPF A2A5
Assembly
4B-2
4B-9.
Removing the VCO Board, A2A1
4B-2
(Continued on page iv)