Fluke 6060B - Digital Test Results

MAINTENANCE
TROUBLESHOOTING
AND
REPAIR
Table
4D-4. BBB Field Test Results
BBB
(CODE)
SYNTH, FREQ.
(MHZ)
MAX.
WAIT
CMS)
XOENL
BIT
EXPECTED
RESULT
001
245 120
0
Locked
002
525
5
0
Unlocked
004 525
95 0
Locked
010
225 120
0
Unlocked
020 385
120 0
Locked
040
550 120
0
Unlocked
100
385 120
1
Unlocked
200
385 200
0
Locked
The
Generator RAM is
verified
by writing data to each
memory location and
checking
that the
same data can be read
back.
Both the off-chip RAM (U25)
and the
on-chip
RAM
(U
1)
are
tested in this manner.
The RAM test is only done
during the power-on
self test.
The data
in
each of the three
calibration EPROMs; VCO (U23),
Output (U24),
and
Attenuator (U26)»
are summed and
compared
with a checksum.
The data in
each
word of the two
program EPROMs
(U21j
22)
are successively
summed
and
rotated
by
two. The
result of this
procedure is
compared
with
a
checksum
for each
EPROM.
Table
4D-5
shows
the CCC
field
results.
4D-21.
ODD FIELD
DDD is
the result of the Output
filter tests. During these tests,
the level is
programmed
to
+13.0 dBm with
level correction applied. The
low-pass filters on
the A2A4
Output
assembly
are tested by
setting
the frequency near the
high end of each of the
four
half-
octave
non-het
bands and checking for a
leveled condition. Then,
the frequency is
set
above the cutoff
frequencies of two of the
filters,
and the output is
checked for an
unleveled condition.
Table
4D-6 shows the DDD
field
Results.
Table 4D-5. CCC
Field Test
Results
CCC
(CODE)
DIGITAL TEST
001
IEEE-488 option test
002
Non-volatile
memory test
004
RAM test
010
Attenuator
calibration
EPROM
checksum
020
Output
calibration EPROM
checksum
040
Synthesizer
calibration EPROM
checksum
100
Lower program
EPROM checksum
200 Upper
program EPROM
checksum
Table 4D-6. ODD Field
Test
Results
DDD
(CODE)
FREQ
(MHZ)
MIDL
HAOCTH
expected
RESULT
001
349.99999 0 1
leveled
002
511.99999 0 0
leveled
004 729.99999
1 0
Leveled
010
1050.00000 1 1
leveled
020 490.00000
0 1
unleveled
040 1024.00000
1 0
unleveled
4D-7