GE Power Management LPS-O Line Protection System 1-
19
1 PRODUCT DESCRIPTION 1.7 SELF-TEST FEATURES
1
The components tested in the background are listed in Table 9–2: RUN-TIME BACKGROUND SELF-TESTS
on page 9–3. Testing of I/O hardware is done in the foreground so that the processors know when a compo-
nent or port is in use and not available for testing. The components tested in the foreground are listed in Table
9–3: RUN-TIME FOREGROUND SELF-TESTS on page 9–3. Some foreground tests are performed every
sample period, while others are performed less frequently.
As with background self-tests, any failed foreground test is repeated and must fail three consecutive times to
be considered a failure. Although not specifically a self-test, the trip circuit continuity monitoring is performed
as a foreground test. Refer to Section 1.5.12: TRIP CIRCUIT MONITOR on page 1–15 for details.
The operator may initiate a visual-response test of the keypad and display components. Refer to Chapter 4:
ACCEPTANCE/PERIODIC TESTS for details.
1.7.3 CONTINUOUS MONITOR
The LPS-O relay includes a Continuous Monitor feature in addition to its self-test features. The continuous
monitor is intended to detect any LPS-O tripping units (Zone 2 or Zone 3 phase distance functions, 50G or 50
overcurrent functions) that are in the picked-up condition without a corresponding operation of the Fault Detec-
tor. If such a condition occurs and persists for 1 second, the LPS-O relay will issue a non-critical alarm and log
a continuous monitor event.
These Continuous Monitor Alarm points can be found in Table 2–6: INDEX NUMBERS – CONFIGURABLE
LOGIC & PROGRAMMABLE OUTPUT SIGNALS on page 2–33
.
The Index numbers used for the Continuous
Monitor are as follows: 48 (Trip Circuit alarm); 49 (Zone flags On alarm); 50 (Overcurrent alarm); and 51
(Unbalanced Current Detector alarm). They are assigned in the default settings as inputs to the non-critical
alarm. These flags may also be used in configurable logic or assigned to other alarm contacts.
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