Jitter Measurements panel measurements.
Measurement Description
Phase Noise The RMS magnitude of all integrated jitter falling within a specified offset range of the
fundamental clock frequency. This measurement is taken on the entire waveform record.
TIE The difference in time between an edge in the source waveform and the corresponding edge in
a recovered reference clock signal. The measurement is made on each waveform edge in the
measurement region.
See also. Measurement configuration menu overview on page 164
The Jitter tab (Advanced Jitter and Eye Analysis) (optional)
The Jitter tab lists advanced jitter, eye, amplitude, and timing measurements that you can add to the Results bar. The Jitter tab is
only shown if you have purchased and installed Advanced Jitter and Eye Analysis (optional).
To open the Jitter measurements tab:
1. Tap Add New... Measure button.
2. Tap the Jitter tab.
To add a measurement to the Results bar:
1. Select the signal source.
2. Select a measurement panel.
3. Select a measurement.
4. Tap Add. You can also double-tap a measurement to add it to the Results bar.
Adding eye diagram plots for a jitter measurement. To display an eye diagram plot for a jitter measurement, double-tap the
jitter measurement badge for which you want to show an eye diagram. If available, tap the Eye Diagram plot button.
Menus and dialog boxes
MSO54, MSO56, MSO58, MSO58LP, MSO64 Help 157
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