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Abov MC96F6432S Series - Page 274

Abov MC96F6432S Series
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274
MC96F6432S
ABOV Semiconductor Co., Ltd.
5) ESD Test Method : I/O (Pin-to-Pin) Mode
I/O pins are zapped, pin by pin.
I/O pins which are not zapped are grounded.
All power pins (VDD and VSS) are floated.
6) ESD Class
HBM (Human-Body-Model) : 3A
M.M. (Machine-Model) : B

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