Field Service Manual December 2003
Page 207 of 276
TestJobs – Freq and Delay
Parametersettings before starting freq and delay tests:
4 Resolution (dpi) : 2000 (half base resolution)
5 Number of beams : 24 (SW860)
10 X expand factor (ppm) : 0
11 Y expand factor (ppm) : 0
12 Film type in use : 0
Extra parametersettings:
3 Chart home pos (1/6400 mil) : “Filmsize depending”
6 Index to first pxl (1/32 mil) : “about 300000”
91 ADC value for exp. (Cr Probe) : 1800
• Freq and Delay - tests are made in ‘Expose’ mode
Maccon:
Ready to work <M>
Select frequency and delay test [1]
Initial offset on freq.:
Increment on freq. :
Initial offset on delay:
Increment on delay:
Ini. Offset on power : 0
Increment on power: 0
Duty_test : forced duty cycle for 2000ppi, depending on ‘delayclk’. [ Half of
base resolution ]
Ssipro:
On de ‘iiiiii’ <ctrl><c> or reset ssipro.
Select [y] for rebooting and [t] for testjobs
ppi? 2000
beamcount? 24 (12)
filmtype? 0 (par12)
shrx? 0
shry? 0
mode? 0 ;freq-del
→
power=1
period? 4 (8) ;number of pixels between ref. beam and beam number
duty cycle? 0 ;only used in mode 1
box length(0=short,1=long)? 0 ;must be short for Freq.&delay job
head(12=MB12, 24=MB24)? 24 (12)
scanline count? 6000 ;width of job
expose count(number of jobs)? X
film count? 1
Display debug data[y/n]? n
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