10.17
Date Code 20020903 SEL-587Z Instruction Manual
Testing and Troubleshooting
Relay Self-Tests
Relay Self-Tests
The SEL-587Z runs a variety of self-tests. The relay takes the following
corrective actions for out-of-tolerance conditions (see Table 10.6):
The relay disables protection elements and trip/close logic. All
output contacts are de-energized. The EN front-panel LED is
extinguished.
The ALARM output contact signals an alarm condition by
going to the de-energized state. If the ALARM output contact
is a “b” contact (normally closed), it closes for an alarm
condition or if the relay is de-energized. If the ALARM output
contact is an “a” contact (normally open), it opens for an alarm
condition or if the relay is de-energized. Alarm condition
signaling can be five-second pulses (Pulsed) or permanent
(Latched).
The relay generates automatic STATUS reports at the serial
port for warnings and failures.
The relay displays failure messages on the relay LCD display
for failures.
Use the serial port STATUS command or front-panel {STATUS} pushbutton
to view relay self-test status.
Table 10.6 Relay Self-Tests (Sheet 1 of 2)
Self-Test Condition Limits
Protection
Disabled
ALARM Output Description
87A, 87B, 87C, IA,
IB, IC offset
Warning 30 mV No Pulsed Measures the dc offset
at each of the current input
channels every 0.2 seconds.
Master offset Warning
Failure
20 mV
30 mV
No
Yes
Pulsed
Latched
Measures the dc offset
at the A/D every 0.2 seconds.
+5 V PS Warning
Failure
+4.75 V
+5.25 V
+4.70 V +5.50 V
No
Yes
Pulsed
Latched
Measures the +5 V
power supply every 0.2 seconds.
±5 V REG Warning
Failure
±4.65 V
±5.35 V
±4.50 V ±5.50 V
No
Yes
Pulsed
Latched
Measures the regulated 5 V
power supply every 0.2 seconds.
±10 V PS Warning
Failure
±9.00 V
±11.00 V
±8.00 V
±12.00 V
No
Yes
Pulsed
Latched
Measures the 10 V
power supply every 0.2 seconds
VBAT Warning
Failure
+2.25 V
+5.00 V
+2.10 V
+6.00 V
No
No
Pulsed
Pulsed
Measures the Real Time clock bat-
tery every 0.2 seconds.
TEMP Warning
Failure
–40° +85°C
–50° +100°C
No
Yes Latched
Measures the
temperature at
the A/D voltage
reference every 0.2 seconds.
RAM Failure Yes Latched Performs a read/write test
on system RAM every 60 seconds.