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Tektronix Keithley 4200A-SCS
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Section 8: Use the 4200A-CVIV Multi-Switch 4200A-SCS Parameter Analyzer User's Manual
8-4 4200A-900-01 Rev. D/April 2020
Set up the measurements in Clarius
This section describes how to set up the 4200A-SCS to control the 4200A-CVIV to automatically
switch between I-V and C-V measurements.
For this example, you use the Clarius application to:
Create a new project
Add and configure a CVU compensation action
Add a MOSFET device
Add and configure an action for switching the SMUs
Add a test for making I-V measurements
Add and configure an action for switching the CVU
Add a test for making C-V measurements
Run the project
View and analyze the test results
The project created in this example is used for two different purposes:
1. The project collects C-V connection compensation constants for all of the 4200A-CVIV channel
configurations that include C-V measurements. This step only needs to be performed once for
each configuration.
2. The project runs the tests on the MOSFET. The 4200A-SCS is configured to connect the SMUs
to the MOSFET and produce a Vds-Id family of curves. Then the project re-configures the
4200A-SCS to connect the CVU to the MOSFET and make a C-V measurement between the
gate of the MOSFET (CV HI) and the source, drain, and bulk (CV LO).
You can use this same general procedure to create tests for other devices and for other applications.
You can also configure the project to make multiple I-V measurements and multiple C-V
measurements on the same device with different 4200A-CVIV configurations.
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