Ublox SARA-R4 Series - Page 154

SARA-R4/N4 series-AT Commands Manual
UBX-17003787 - R09

14System features
Page 154 of 307
Type Syntax Response Example
Output pins definition
Set AT+UTEST=10,4,[<bit_
padding>]<pin_seq>
OK AT+UTEST=10,4,"00000000100000
002000"
OK
Digital testing execution
Set AT+UTEST=10,5 OK AT+UTEST=10,5
OK
Digital value measurement
Set AT+UTEST=10,6 <bit_padding>]<pin_seq>
OK
AT+UTEST=10,6
00000004100000003000
OK
Read AT+UTEST? +UTEST: <mode>
OK
+UTEST: 1
OK
Test AT+UTEST=? +UTEST: (list of supported
<mode>s)
OK
+UTEST: (0-3)
OK
14.5.9Defined values
Parameter Type Description
<op_code> Number Test mode setting:
• 0: exits the test interface and restore the pins to the original configuration
• 2: defines a set of pins that will be tested and initialize these pins to be ready
for testing. The original pins configuration is kept for final restore. In the [<bit_
padding>]<pin_seq> parameter use this notation to represent each module pin
with its binary digit:
o 0: the pin will not be tested
o 1: the pin will be tested (as digital input or output)
• 3: configures the logical pins previously enabled for testing as output or input; the
command has effect only if AT+UTEST=10,2 has been previously issued.
In case a not enabled pin is set as digital input or output, the command does not
return an error and the setting is not applied. In the [<bit_padding>]<pin_seq>
parameter use this notation to represent each module pin with its binary digit:
o 0: the pin will be set as an output
o 1: the pin will be set as an input
• 4: configures the value of the output pins under testing; the command has
effect only if AT+UTEST=10,3 has been previously issued; The command is not
mandatory if there are not output pins to configure. In the [<bit_padding>]<pin_
seq> parameter use this notation to represent each module pin with its binary digit:
o 0: the pin will output a "low" logic level
o 1: the pin will output a "high" logic level
• 5: apply the setting change defined with <op_code>= 2 / 3 / 4 and triggers the
execution of the digital testing. Digital testing of the pins is possible only after the
execution of the AT+UTEST=10,5 command.
• 6: returns the logic value of pins under testing (both input and output); in the [<bit_
padding>]<pin_seq> parameter use this notation to represent each module pin
with its binary digit:
o 0: "low" logic digital level measured at the module pin
o 1: "high" logic digital level measured at the module pin
[<bit_
padding>]<pin_seq>
Number Sequence of hexadecimal digits containing the pin information and the action to
execute:
• SARA-R4 / SARA-N4 - See the Notes and End User Test Application Note [133] for
detailed number description
14.5.10Notes
• Consider these steps to construct the [<bit_padding>]<pin_seq> sequence:
o Consider the total number of the module's pins available