Agilent Technologies 35670A

Swept Sine Measurements —Option 1D2
Dynamic range
Default span: 51.2 Hz to 51.2 kHz
Fast average ON, 101 point log sweep
Tested with 11 dBVrms source level at 100 ms
integration (approximately 60 second sweep)
130 dB typical
Arbitrary Waveform Source—Option 1D4
Amplitude Range Arb: ±5 Vpk †
dc: ±10 V †
†V
pk
+|Vdc| ≤10 V
Record Length
Depends on measurement resolution (100,
200, 400, 800, and 1600 lines)
# of points = 2.56 x lines of resolution, or # of
complex points = 1.28 x lines of resolution
Point spacing Matches the measurement sample rate.
DAC Resolution
0.2828 Vpk to 5 Vpk
<0.2828 Vpk
2.5 mV
0.25 mV
Agilent 35670A Specifications
Swept Sine Measurements —Option 1D2
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