Agilent Technologies 35670A - Page 401

Self Test GPIB Command
[ SELF TEST ]
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[ FUNCTIONL TESTS ]
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[ DIGITAL PROCESSOR ]
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[ TRIGGER ]
TEST:DSP:TRIG; *WAI
[ LO ]
TEST:DSP:LO; *WAI
[ DIGITAL FILTER ]
TEST:DSP:FILT; *WAI
[ FIFO ]
TEST:DSP:FIFO; *WAI
[ BASEBAND ]
TEST:DSP:BAS; *WAI
[ ZOOM ]
TEST:DSP:ZOOM; *WAI
[ DGTL SRCE THRU DSP ]
TEST:DSP:SOUR; *WAI
[ ALL ]
TEST:DSP:ALL; *WAI
[ SOURCE ]
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[ SOURCE LO ]
TEST:SOUR:LO; *WAI
[ SOURCE TO CPU ]
TEST:SOUR:CPU; *WAI
[ WITHOUT LO ]
TEST:SOUR:BAS; *WAI
[ WITH LO ]
TEST:SOUR:ZOOM; *WAI
[ ALL ]
TEST:SOUR:ALL; *WAI
[ INPUTS ]
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[ OFFSET ]
TEST:INP:OFFS; *WAI
[ DISTORTN ]
TEST:INP:DIST; *WAI
[ INPUT TRIGGER ]
TEST:INP:TRIG; *WAI
[ INPUT A-WEIGHT ]
TEST:INP:AWE; *WAI
[ AAF BYPASS ]
TEST:INP:AAF; *WAI
[ INPUT ICP ]
TEST:INP:ICP; *WAI
[ ALL ]
TEST:INP:ALL; *WAI
[ TACHOMETR ]
TEST:TACH; *WAI
[ ADC GATE ARRAY ]
TEST:ADC:GARR; *WAI
[ OTHER ]
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[ INTERRUPT ]
TEST:PROC:INT; *WAI
[ MULT FCTN PERIPHERL ]
TEST:PROC:MFP; *WAI
[ ALL ]
TEST:PROC:ALL; *WAI
[ ALL ]
TEST:ALL; *WAI
[ LOOP MODE ON/OFF ]
TEST:LOOP:MODE ON|OFF
[ TEST LOG ]
DISP:CONT TTAB
[ CLEAR TEST LOG ]
TEST:LOG:CLE
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Agilent 35670A Internal Test Descriptions
Self-Test Descriptions
10-19