Agilent Technologies 35670A - Page 433

part number 7-5
fast bus
interface 8-28
self-test description 10-14
troubleshooting 4-29
fault log messages 10-9
FIFO gate array self test 10-14
flatness
adjustment 5-17
test 3-18
frequency accuracy test 3-22
frequency reference
adjustment 5-5
circuit description 8-24
clock 8-25
front panel ii
part numbers 7-9
removing 6-8
self-test description 10-14
front panel connectors 8-36 - 8-37
See also BNC assembly
functional tests
See self tests
fuse 2-10
part numbers 7-12
G
GPIB
connector 2-12
interface 8-33
self-test description 10-14
signal descriptions 9-14
troubleshooting 4-31
GPIB commands
for adjustments 5-4
for self tests 10-18
grounding requirements 2-3
H
harmonic distortion test 3-25
I
IBASIC 8-2
ICP source 8-6, 8-12
ICP supply test 3-41
IIC bus
controller 8-28
self-test description 10-14
signals 8-29, 9-8
troubleshooting 4-25
incoming inspection 2-5
individual self-test descriptions 10-13
initial verification troubleshooting 4-5
input
coupling test 3-24
resistance test 3-39
self-test description 10-14 - 10-15
input assembly
circuit description 8-6, 8-12
common mode adjustment 5-13
dc offset adjustment 5-10
flatness adjustment 5-17
part number 7-5
procedures required after replacing 6-4
signal descriptions 9-7
troubleshooting 4-51
troubleshooting four channels 4-54
installation 2-7
instrument BASIC 8-2
interface
GPIB 2-12
parallel 2-11
serial 2-11
intermittent failures 4-31, 4-40
intermodulation distortion test 3-28
interrupt self test 10-15
K
keyboard 2-14
See primary keypad
See secondary keypad
keyboard controller assembly
circuit description 8-35
part number 7-5
signal description 9-18
L
LO gate array self test 10-15
local oscillator
circuit description 8-22
See digital assembly
long confidence self test 10-15
3